Tolerance Compliance & Process Capability Calculator — Margin, Deviation, Cp and Cpk Validator
Tolerance Compliance & Process Capability Calculator — Margin, Deviation, Cp and Cpk Validator
Enter the known values and review the calculated result
Input parameters
Use consistent values and select the intended engineering units.
Evaluation mode
Nominal & tolerances
Measurement
Statistical parameters
Results
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Method, application and limitations
Review the calculation method, intended application and engineering assumptions before using the result in a design decision.
Formula and calculation method
compliance status formula:
U = N + T+
L = N – T–
ΔU = U – X
ΔL = X – L
Compliance status = 1 when ΔU ≥ 0 and ΔL ≥ 0; otherwise Compliance status = 0
margin to nearest limit formula:
M = min(ΔU, ΔL) when the value is within limits
M = -min(|ΔU|, |ΔL|) when the value is outside limits
normalized deviation formula:
η = (X – N) / T+ when X ≥ N
η = (X – N) / T– when X < N
where:
- N — Nominal value [—]
- T+ — Upper tolerance [—]
- T– — Lower tolerance [—]
- X — Actual value [—]
- U — Upper limit [—]
- L — Lower limit [—]
- ΔU — Distance to upper limit [—]
- ΔL — Distance to lower limit [—]
- M — Margin to nearest limit [—]
- η — Normalized deviation [—]
When to use this calculator
When to use this calculator:
- Checking whether a measured part dimension is inside asymmetric upper and lower tolerance limits.
- Calculating the remaining margin between an actual measurement and the nearest tolerance boundary.
- Comparing actual deviation from nominal value against different upper and lower tolerances.
- Evaluating process capability when process mean and standard deviation are available.
- Estimating defect probability from process mean, standard deviation and tolerance limits.
How to interpret the result
Compliance status is defined as a binary result: 1 means the actual value is inside the tolerance limits, and 0 means the actual value is outside at least one limit.
Margin to nearest limit is defined as the distance from the actual value to the closest tolerance boundary. A positive margin means the value is inside limits, and a negative margin means the value is outside limits.
Normalized deviation is defined as the deviation from nominal value divided by the applicable tolerance side. Values above nominal use the upper tolerance, and values below nominal use the lower tolerance.
- Safe — in measurement mode, the actual value is within limits and absolute normalized deviation is ≤ 0.9; in process mode, the actual value is within limits and Cpk ≥ 1.33.
- Warning — in measurement mode, the actual value is within limits and absolute normalized deviation is > 0.9; in process mode, the actual value is within limits and 1 ≤ Cpk < 1.33.
- Unsafe — the actual value is outside the tolerance limits, or in process mode Cpk < 1.
- Invalid — required numeric inputs are missing or invalid, tolerance values are not greater than zero, process mode is selected without valid standard deviation and process mean, or the evaluation mode is not measurement or process capability.
The result is used to decide whether the measured value passes tolerance compliance and, in process mode, whether the process has sufficient capability margin.
Calculation example
Example:
A user checks a measured shaft dimension against an asymmetric tolerance range before accepting the part.
- N — Nominal value = 50.00
- T+ — Upper tolerance = 0.10
- T– — Lower tolerance = 0.05
- X — Actual value = 50.07
- Mode = Measurement
U = 50.10, L = 49.95, ΔU = 0.03, ΔL = 0.12, M = 0.03, η = 0.700, Compliance status = 1.
Assumptions and limitations
- The upper limit is calculated as nominal value plus upper tolerance.
- The lower limit is calculated as nominal value minus lower tolerance.
- Upper and lower tolerances must be greater than zero.
- Measurement mode evaluates the actual value against tolerance limits and normalized deviation.
- Process capability mode requires standard deviation greater than zero and a finite process mean.
- Process capability mode calculates Cp, Cpk, distance to limit and defect probability from the tolerance span, process mean and standard deviation.
